Neutron energy dependence of semiconductor soft errors was successfully measured for the first time

Joint press release by Nippon Telegraph and Telephone Corporation, Nagoya University, and Hokkaido University

Nippon Telegraph and Telephone Corporation, Nagoya University, and Hokkaido University successfully measured semiconductor soft error rates at continuously varying neutron energies from 1MeV to 800MeV. The findings reveal, for the first time, the complete picture of the energy dependence of semiconductor soft errors.

Click here to read the joint press release.